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arXiv · 1210.3655

Reliable transport through a microfabricated X-junction surface-electrode ion trap

Kenneth Wright·Jason M. Amini·Daniel L. Faircloth·Curtis Volin·S. Charles Doret·Harley Hayden·C. -S. Pai·David W. Landgren·Douglas Denison·Tyler Killian·Richart E. Slusher·Alexa W. Harter
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Abstract

We report the design, fabrication, and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a ninety-degree cross. The trap is fabricated with very-large-scalable-integration (VLSI) techniques which are compatible with scaling to a larger quantum information processor. The shape of the radio-frequency (RF) electrodes is optimized with a genetic algorithm to minimize axial pseudopotential barriers and to minimize ion heating during transport. Seventy-eight independent DC control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs, trapping of ion chains with nearly-equal spacing in one of the trap's linear sections, and merging and splitting ions from these chains. Doppler-cooled ions survive more than 10^5 round-trip transits between junction legs without loss and more than sixty-five consecutive round trips without laser cooling.

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Kenneth Wright, Jason M. Amini, Daniel L. Faircloth, Curtis Volin, S. Charles Doret, Harley Hayden, C. -S. Pai, David W. Landgren, Douglas Denison, Tyler Killian, Richart E. Slusher, Alexa W. Harter. 2012-10-12. Reliable transport through a microfabricated X-junction surface-electrode ion trap. https://doi.org/10.1088/1367-2630%2F15%2F3%2F033004

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