arXiv · 1611.04556
Controlling the growth of Bi(110) and Bi(111) films on an insulating substrate
Abstract
Here we demonstrate the controlled growth of Bi(110) and Bi(111) films on an (insulating) $\alpha$-Al$_2$O$_3$(0001) substrate by surface X-ray diffraction and X-ray reflectivity using synchrotron radiation. At temperatures as low as 40 K, unanticipated pseudo-cubic Bi(110) films are grown having a thickness ranging from a few to tens of nanometers. The roughness at the film-vacuum as well as at the film-substrate interface, can be reduced by mild heating, where a crystallographic orientation transition of Bi(110) towards Bi(111) is observed at 400 K. From 450 K onwards high quality and ultrasmooth Bi(111) films are formed. Growth around the transition temperature results in the growth of competing Bi(110) and Bi(111) thin film domains.
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Maciej Jankowski, Daniel Kamiński, Kurt Vergeer, Marta Mirolo, Francesco Carla, Guus Rijnders, Tjeerd R. J. Bollmann. 2016-11-14. Controlling the growth of Bi(110) and Bi(111) films on an insulating substrate. https://doi.org/10.1088/1361-6528/aa61dd
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