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arXiv · 1809.09926

Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe

Hamish G. Brown·Zhen Chen·Matthew Weyland·Colin Ophus·Jim Ciston·Les J. Allen·Scott D. Findlay
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Abstract

The projected electrostatic potential of a thick crystal is reconstructed at atomic-resolution from experimental scanning transmission electron microscopy data recorded using a new generation fast- readout electron camera. This practical and deterministic inversion of the equations encapsulating multiple scattering that were written down by Bethe in 1928 removes the restriction of established methods to ultrathin ($\lesssim 50$ Å) samples. Instruments already coming on-line can overcome the remaining resolution-limiting effects in this method due to finite probe-forming aperture size, spatial incoherence and residual lens aberrations.

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Hamish G. Brown, Zhen Chen, Matthew Weyland, Colin Ophus, Jim Ciston, Les J. Allen, Scott D. Findlay. 2018-09-26. Structure retrieval at atomic resolution in the presence of multiple scattering of the electron probe. https://doi.org/10.1103/physrevlett.121.266102

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