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arXiv · 1811.05323

A semi-empirical integrated microring cavity approach for 2D material optical index identification at 1.55 μm

Rishi Maiti·Rohit A. Hemnani·Rubab Amin·Zhizhen Ma·Mohammad H. Tahersima·Tom A. Empante·Hamed Dalir·Ritesh Agarwal·Ludwig Bartels·Volker J. Sorger
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Abstract

Atomically thin two-dimensional (2D) materials provide a wide range of basic building blocks with unique properties, making them ideal for heterogeneous integration with a mature chip platform for advances in optical communication technology. Control and understanding of the precise value of the optical index of these materials, however, is challenging, due to the small lateral flake dimension. Here we demonstrate a semi-empirical method to determine the index of a 2D material (nMoTe2 of 4.36+0.011i) near telecommunication-relevant wavelength by integrating few layers of MoTe2 onto a micro-ring resonator. The placement, control, and optical-property understanding of 2D materials with integrated photonics paves a way for further studies of active 2D material-based optoelectronics and circuits.

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Rishi Maiti, Rohit A. Hemnani, Rubab Amin, Zhizhen Ma, Mohammad H. Tahersima, Tom A. Empante, Hamed Dalir, Ritesh Agarwal, Ludwig Bartels, Volker J. Sorger. 2019-12-22. A semi-empirical integrated microring cavity approach for 2D material optical index identification at 1.55 μm. https://arxiv.org/abs/1811.05323

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