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arXiv · 1906.01717

Standard-Based EBSD: Fingerprinting of Order and Orientation in Materials

Aimo Winkelmann·Grzegorz Cios·Tomasz Tokarski·Gert Nolze·Ralf Hielscher·Tomasz Kocieł
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Abstract

Orientation determination does not necessarily require complete knowledge of the local atomic arrangement in a material. We present a method for microstructural phase discrimination and orientation analysis of phases for which there is only limited information available. In this method, experimental Kikuchi diffraction patterns are utilized to generate self-consistent standards for use in the technique of Electron Backscatter Diffraction (EBSD). As an application example, we map the locally varying orientations in samples of icosahedral quasicrystals observed in a Ti40Zr40Ni20 alloy.

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Aimo Winkelmann, Grzegorz Cios, Tomasz Tokarski, Gert Nolze, Ralf Hielscher, Tomasz Kocieł. 2019-06-04. Standard-Based EBSD: Fingerprinting of Order and Orientation in Materials. https://arxiv.org/abs/1906.01717

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