arXiv · 2011.08056
Ionic Charge Distributions in Silicon Atomic Wires
Abstract
Using a non-contact atomic force microscope (nc-AFM), we examine continuous DB wire structures on the hydrogen-terminated silicon (100) 2x1 surface. By probing the DB structures at varying energies, we identify the formation of previously unobserved ionic charge distributions correlated to the net charge of DB wires and their predicted lattice distortion. Performing spectroscopic analysis, we identify higher energy configurations corresponding to alternative lattice distortions as well as tip-induced charging effects. By varying the length and orientation of these DB structures, we further highlight key features in the formation of these ionic surface phases.
Explore related subjects
Keep this discovery
Jeremiah Croshaw, Taleana Huff, Mohamad Rashidi, John Wood, Erika Lloyd, Jason Pitters, Robert Wolkow. 2020-11-16. Ionic Charge Distributions in Silicon Atomic Wires. https://doi.org/10.1039/d0nr08295c
Cite the original work for its findings. Save a collection to share your selection of sources.