Scanning X-ray Diffraction Microscopy for Diamond Quantum Sensing

Mason C. Marshall; David F. Phillips; Matthew J. Turner; Mark J. H. Ku; Tao Zhou; Nazar Delegan; F. Joseph Heremans; Martin V. Holt; Ronald L. Walsworth

doi:10.1103/physrevapplied.16.054032

arXiv · 2103.08388

Scanning X-ray Diffraction Microscopy for Diamond Quantum Sensing

Mason C. Marshall·David F. Phillips·Matthew J. Turner·Mark J. H. Ku·Tao Zhou·Nazar Delegan·F. Joseph Heremans·Martin V. Holt·Ronald L. Walsworth

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Abstract

Understanding nano- and micro-scale crystal strain in CVD diamond is crucial to the advancement of diamond quantum technologies. In particular, the presence of such strain and its characterization present a challenge to diamond-based quantum sensing and information applications -- as well as for future dark matter detectors where directional information of incoming particles is encoded in crystal strain. Here, we exploit nanofocused scanning X-ray diffraction microscopy to quantitatively measure crystal deformation from defects in diamond with high spatial and strain resolution. Combining information from multiple Bragg angles allows stereoscopic three-dimensional modeling of strain feature geometry; the diffraction results are validated via comparison to optical measurements of the strain tensor based on spin-state-dependent spectroscopy of ensembles of nitrogen vacancy (NV) centers in the diamond. Our results demonstrate both strain and spatial resolution sufficient for directional detection of dark matter via X-ray measurement of crystal strain, and provide a promising tool for diamond growth analysis and improvement of defect-based sensing.

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Mason C. Marshall, David F. Phillips, Matthew J. Turner, Mark J. H. Ku, Tao Zhou, Nazar Delegan, F. Joseph Heremans, Martin V. Holt, Ronald L. Walsworth. 2022-10-14. Scanning X-ray Diffraction Microscopy for Diamond Quantum Sensing. https://doi.org/10.1103/physrevapplied.16.054032

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