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arXiv · 2106.02337

Eliminating uncertainty of thermal emittance measurement in solenoid scans due to rf and solenoid fields overlap

Lianmin Zheng·Yingchao Du·Pengwei Huang
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Abstract

The solenoid scan is one of the most common methods for the in-situ measurement of the thermal emittance of a photocathode in an rf photoinjector. The fringe field of the solenoid overlaps with the gun rf field in quite a number of photoinjectors, which makes accurate knowledge of the transfer matrix challenging, thus increases the measurement uncertainty of the thermal emittance. This paper summarizes two methods that have been used to solve the overlap issue and explains their deficiencies. Furthermore, we provide a new method to eliminate the measurement error due to the overlap issue in solenoid scans. The new method is systematically demonstrated using theoretical derivations, beam dynamics simulations, and experimental data based on the photoinjector configurations from three different groups, proving that the measurement error with the new method is very small and can be ignored in most of the photoinjector configurations.

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Lianmin Zheng, Yingchao Du, Pengwei Huang. 2021-06-07. Eliminating uncertainty of thermal emittance measurement in solenoid scans due to rf and solenoid fields overlap. https://doi.org/10.1016/j.nima.2021.166149

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