arXiv · 2108.11086
Simulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions
Abstract
We present numerical simulations of scattering-type Scanning Near-Field Optical Microscopy (s-SNOM) of 1D plasmonic graphene junctions. A comprehensive analysis of simulated s-SNOM spectra is performed for three types of junctions. We find conditions when the conventional interpretation of the plasmon reflection coefficients from s-SNOM measurements does not apply. Our results are applicable to other conducting 2D materials and provide a comprehensive understanding of the s-SNOM techniques for probing local transport properties of 2D materials.
Explore related subjects
Keep this discovery
Vyacheslav Semenenko, Mengkun Liu, Vasili Perebeinos. 2021-08-25. Simulation of Scanning Near-Field Optical Microscopy Spectra of 1D Plasmonic Graphene Junctions. https://doi.org/10.1364/oe.450323
Cite the original work for its findings. Save a collection to share your selection of sources.