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arXiv · 2201.07549

Simulating dark-field x-ray microscopy images with wave front propagation techniques

Mads Carlsen·Carsten Detlefs·Can Yildirim·Trygve Ræder·Hugh Simons
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Abstract

Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical simulations of image-formation in such a microscope using numerical integration of the dynamical Takagi-Taupin Equations (TTE) and wave front propagation. We validate our approach by comparing simulated images to experimental data from a near-perfect single crystal of diamond containing a single stacking fault defect in the illuminated volume.

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Mads Carlsen, Carsten Detlefs, Can Yildirim, Trygve Ræder, Hugh Simons. 2022-01-19. Simulating dark-field x-ray microscopy images with wave front propagation techniques. https://arxiv.org/abs/2201.07549

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