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arXiv · 2202.11587

Resonant Soft X-Ray Scattering on LaPt$_2$Si$_2$

Deepak John Mukkattukavil·Johan Hellsvik·Anirudha Ghosh·Evanthia Chatzigeorgiou·Elisabetta Nocerino·Qisi Wang·Karin von Arx·Shih-Wen Huang·Victor Ekholm·Zakir Hossain·Arumugum Thamizhavel·Johan Chang·Martin Mansson·Lars Nordstrom·Conny Sathe·Marcus Agaker·Jan-Erik Rubensson·Yasmine Sassa
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Abstract

X-ray absorption (XAS) and Resonant Inelastic X-ray Scattering (RIXS) spectra of LaPt$_2$Si$_2$ single crystal at the Si L and La N edges are presented. The data are interpreted in terms of density functional theory, showing that the Si spectra can be described in terms of Si $s$ and $d$ local partial density of states (LPDOS), and the La spectra are due to quasi-atomic local $4f$ excitations. Calculations show that Pt $d$-LPDOS dominates the occupied states, and a sharp localized La $f$ state is found in the unoccupied states, in line with the observations.

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Deepak John Mukkattukavil, Johan Hellsvik, Anirudha Ghosh, Evanthia Chatzigeorgiou, Elisabetta Nocerino, Qisi Wang, Karin von Arx, Shih-Wen Huang, Victor Ekholm, Zakir Hossain, Arumugum Thamizhavel, Johan Chang, Martin Mansson, Lars Nordstrom, Conny Sathe, Marcus Agaker, Jan-Erik Rubensson, Yasmine Sassa. 2022-02-23. Resonant Soft X-Ray Scattering on LaPt$_2$Si$_2$. https://arxiv.org/abs/2202.11587

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