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arXiv · 2307.07071

Elastic Modulus of Polycrystalline Halide Perovskite Thin Films on Substrates

Madhuja Layek·In Seok Yang·Zhenghong Dai·Anush Ranka·Truong Cai·Brian W. Sheldon·Eric Chason·Nitin P. Padture
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Abstract

Using an innovative combination of multi-beam-optical stress-sensor (MOSS) curvature and X-ray diffraction (XRD) techniques, the Young's modulus (E) of polycrystalline MAPbI3 metal-halide perovskite (MHP) thin films attached to Si substrates is estimated to be 10.2 +/- 3.4 GPa. This is comparable to the E of corresponding MAPbI3 single-crystals. This generic method could be applied to other systems to estimate hard-to-measure E of thin films.

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Madhuja Layek, In Seok Yang, Zhenghong Dai, Anush Ranka, Truong Cai, Brian W. Sheldon, Eric Chason, Nitin P. Padture. 2023-07-13. Elastic Modulus of Polycrystalline Halide Perovskite Thin Films on Substrates. https://arxiv.org/abs/2307.07071

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