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arXiv · 2311.10326

Multiple origins of extra electron diffractions in fcc metals

Flynn Walsh·Mingwei Zhang·Robert O. Ritchie·Mark Asta·Andrew M. Minor
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Abstract

Diffuse intensities in the electron diffraction patterns of concentrated face-centered cubic solid solutions have been widely attributed to chemical short-range order, although this connection has been recently questioned. This article explores the many non-ordering origins of commonly reported features using a combination of experimental electron microscopy and multislice diffraction simulations, which suggest that diffuse intensities largely represent thermal and static displacement scattering. A limited number of observations may reflect additional contributions from planar defects, surface terminations incommensurate with bulk periodicity, or weaker dynamical effects

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Flynn Walsh, Mingwei Zhang, Robert O. Ritchie, Mark Asta, Andrew M. Minor. 2023-11-17. Multiple origins of extra electron diffractions in fcc metals. https://arxiv.org/abs/2311.10326

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