Ge$_{1-x}$Si$_{x}$ single crystals for Ge hole spin qubit integration

Abstract

Spin qubits are fundamental building blocks of modern quantum computing devices. The path of Ge-based hole-spin qubits has several advantages over Si-based electron-spin systems, such as the absence of valley band degeneracy, the possibility of efficient field control due to large spin-orbit coupling, and smaller effective masses. Among the possible Ge qubit devices, Ge/GeSi planar heterostructures have proven to be favourable for upscaling and fabrication. The Si concentration of the straining GeSi buffer serves as an important tuning parameter for the electronic structure of Ge/GeSi qubits. A particularly low Si concentration of x = 0.15 of the Ge$_{0.85}$Si$_{0.15}$ crystal should enable minimal lattice strain for spin qubit heterostructures, which is difficult to stabilize as a random alloy. We present a synchrotron-based study to investigate the chemical composition, valence band electronic structure and local atomic structure of a Ge$_{0.85}$Si$_{0.15}$ single crystal using the advanced combination of hard X-ray photoelectron spectroscopy (HAXPES), hard X-ray momentum microscopy (HarMoMic) and X-ray photoelectron diffraction (XPD). We found that the Ge$_{0.85}$Si$_{0.15}$ crystal has an individual, uniform valence band structure, with no signs of phase separation. The shapes of the valence bands resemble those of pure Ge, as do the low effective masses. XPD experiments and Bloch wave calculations, show the Si atoms located at Ge lattice sites within the crystal, forming a random alloy. This high chemical, electronic and structural quality of Ge$_{0.85}$Si$_{0.15}$ single-crystal substrates is of crucial importance for their implementation to enable long spin lifetimes in Ge-based hole-spin qubits. The results emphasise the power of combined X-ray spectromicroscopy techniques, which provide key insights into the qubit building blocks that form the basis of quantum technologies.