First-principles characterization of native defects and oxygen impurities in GaAs

Abstract

We present a systematic investigation of native point defects and oxygen impurities in GaAs using hybrid functional calculations. Defects are characterized by their structural, electronic, and optical properties. Under thermodynamic equilibrium, dominant native defects are Ga antisites (Ga$_{\rm As}$), As antisites (As$_{\rm Ga}$), and/or Ga vacancies ($V_{\rm Ga}$) in which As$_{\rm Ga}$ and $V_{\rm Ga}$ are charge-compensating defects under As-rich conditions. On the basis of the defect transition levels, the isolated As$_{\rm Ga}$ can be identified with the $EL2$ center reported in experiments. The defect, however, has a negligible nonradiative electron capture cross section and thus cannot be the ``main electron trap'' as commonly believed. We find that GaAs can have multiple O-related defect centers, especially when prepared under As-rich conditions. The quasi-substitutional O impurity (O$_{\rm As}$) and its complex with two As$_{\rm Ga}$ defects (O$_{\rm As}$-2As$_{\rm Ga}$) both have a metastable and paramagnetic middle (neutral) charge state; however, only the latter can be identified with the experimentally observed Ga--O--Ga or ``OX'' center. These two defects have large nonradiative electron capture cross sections and can be effective carrier traps or recombination centers, which has important implications for materials design.