Device-scale modeling of valley photovoltaics

Daixi Xia; Hassan Allami; Jacob J. Krich

Home/Archive/arXiv

arXiv · 2507.20054

Device-scale modeling of valley photovoltaics

Daixi Xia·Hassan Allami·Jacob J. Krich

View original source ↗Read source document ↗Export metadata ↓

Abstract

We present a Poisson/drift-diffusion model that includes valley scattering effects for simulating valley photovoltaic devices. The valley photovoltaic concept is a novel implementation of a hot-carrier solar cell and leverages the valley scattering effect under large electric field to potentially achieve high voltage and high efficiency. Fabricated devices have shown S-shaped current-voltage curves, low fill factor, and thus low efficiency. We hence develop the first device model for valley photovoltaics. Our model includes electric-field-dependent valley scattering rates extracted from previous ensemble Monte Carlo simulations. We show that the condition of nonequilibrium carrier populations in the satellite valleys is not enough for valley photovoltaics to achieve high efficiency. We also show that increasing the built-in electric field of the valley-scattering region does not improve efficiency, contrary to previous suggestion.

Explore related subjects

physics.app-ph cond-mat.mtrl-sci

Keep this discovery

Explore connections, maps & timelines

BibTeX RIS

Daixi Xia, Hassan Allami, Jacob J. Krich. 2025-07-26. Device-scale modeling of valley photovoltaics. https://arxiv.org/abs/2507.20054

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related papers

arXiv2026

Janus Dipoles: Fundamentals, Realizations, and Emerging Applications

The Janus dipole - featuring orthogonally oriented electric and magnetic dipoles with a 90-degree phase difference - has emerged as a powerful paradigm for wave manipulation. Unlike traditional Huygens dipoles used for directional control, this unique configuration exhibits strongly asymmetric, face-selective near-field behavior while maintaining a quasi-isotropic far-field radiation pattern. These remarkable properties make the Janus dipole an essential platform for directional wave shaping, with wide-ranging applications in on-chip photonics, quantum interactions, and wireless power transfer. This review systematically traces the rapid development of the Janus dipole from its foundational theoretical inception to its diverse implementation platforms across optical, microwave, and acoustic frequencies. In this paper, we explore the governing principles, classify realization strategies into passive Janus dipoles, active Janus dipoles, and advanced near-field coupling control, and highlight emerging frontiers. By bridging foundational electrodynamics with advanced device engineering, this paper serves as an essential reference and roadmap for researchers designing next-generation, highly integrated, and compact wave-manipulation systems.

physics.app-ph↗

arXiv2026

Evaluation of effective wave velocities in polycrystalline materials using the ultrasonic reflection matrix

In-depth characterization of heterogeneous materials has long been a challenge in non-destructive testing. Here, a method is proposed to determine the elastic constants of metallic polycrystalline materials using back-scattered ultrasound. The waves scattered by the microstructure are analyzed to image the effective bulk velocities. To this end, a reflection matrix is acquired with an array of transducers. The projection of this matrix onto a focused basis is used to estimate an average point spread function. Optimizing this function with respect to the propagation model leads to an estimation of the longitudinal velocity. Additional treatments are developed to adapt the method to map the shear wave velocity. The local Poisson's ratio is then deduced from the ratio between those two velocities. Young's modulus and shear modulus can also be obtained assuming known densities. This matrix approach is experimentally validated on different polycrystalline materials. A sample displaying heterogeneous mechanical properties is then simulated to assess the accuracy and the resolution of the method. Its strengths and limitations are discussed, demonstrating its potential for quantitative non-destructive material characterization.

physics.app-ph↗

arXiv2026

Pendellösung length-scale neutron and X-ray interferometry

Neutron and X-ray perfect-crystal interferometers (PCIs) are powerful platforms for studies of fundamental physics and phase-contrast imaging. Further enhancing several PCI capabilities requires reducing crystal blade thickness to the micron scale, which minimizes dynamical-diffraction image blur, permits operation in the pendellösung regime where blade thickness controls beam splitting, and reduces absorption for simultaneous neutron and X-ray operation. However, fabricating multiple crystal blades with identical micrometer-scale thicknesses over centimeter-scale areas remains a major challenge. Here, using a non-etching sub-micron fabrication technique, we demonstrate silicon triple-Laue interferometers with equal-blade-thicknesses of 110 $μ$m and 350 $μ$m, operated with both neutrons and X-rays. These devices are the thinnest PCIs realized to date, enabling a factor-of-six reduction in dynamical-diffraction beam spreading for improved phase-contrast imaging, while reaching the single pendellösung length regime in which crystal thickness provides an experimentally accessible control parameter for engineered quantum-optical beam splitting of plane-wave inputs. These results motivate multi-blade PCI designs utilizing identical half-pendellösung crystal lamellae that are proposed for neutron spin--orbit and electric dipole moment measurements.

physics.app-ph↗