Search arXivSearch

arXiv · 2605.26624

MSCGC-KAN: Multi-scale Causal Graph Convolution and KAN-inspired Analytic-basis Mapping for EEG Emotion Recognition

Abstract

Electroencephalogram (EEG)-based emotion recognition is an important affective computing task, and recent EEG foundation models provide useful generic representations for downstream adaptation. However, under the fine-tuning setting, three limitations remain prominent: insufficient modeling of multi-scale emotional dynamics, inadequate exploitation of inter-channel functional connectivity, and the limited expressive power of simple linear classification heads. To address these issues, this paper proposes a new EEG emotion recognition method, termed MSCGC-KAN, which introduces a structured task head composed of multi-scale causal graph convolution and Kolmogorov--Arnold feature mapping. Built on a pre-trained CBraMod backbone, MSCGC-KAN enhances downstream adaptation by jointly strengthening multi-scale temporal modeling, learnable inter-channel connectivity modeling, and nonlinear discriminative mapping within a compact task-specific head. This design preserves the representation advantage of the foundation model while making the classifier more sensitive to emotion-related spatiotemporal patterns. Extensive experiments are conducted on the public FACED and SEED-VII datasets. The proposed method achieves a balanced accuracy of 60.66\%, a Cohen's Kappa of 0.5525, and a weighted F1-score of 60.40\% on FACED, and obtains 33.27\%, 0.2223, and 33.64\%, respectively, on SEED-VII. Compared with the CBraMod+Linear baseline, the balanced accuracy is improved by 5.91 and 2.03 percentage points on the two datasets, respectively. These results indicate that structured task-head design is an effective way to improve EEG emotion recognition when fine-tuning pre-trained EEG models.

Explore related subjects

Keep this discovery

BibTeXRIS

Haoliang Gong, Qingshan She, Jiale Xu, Yunyuan Gao, Xugang Xi. 2026-08-28. MSCGC-KAN: Multi-scale Causal Graph Convolution and KAN-inspired Analytic-basis Mapping for EEG Emotion Recognition. https://arxiv.org/abs/2605.26624

Cite the original work for its findings. Save a collection to share your selection of sources.

Discover connections

Connections use source metadata and explicit phrase matches, not verified experimental comparisons.

KEEP EXPLORING

Related discoveries

Texture Image Classification Using DWT AlexNet Feature Fusion and Deep Neural Networks

Texture image classification plays a significant role in computer vision applications, including industrial inspection, medical image analysis, remote sensing, and object recognition. Handcrafted features can capture local texture characteristics but may have limited capability to represent complex visual patterns. In contrast, deep learning models automatically learn discriminative representations but may not fully exploit the multiscale spatial-frequency information inherent in texture images. This paper proposes a hybrid feature fusion framework, termed DWT_AlexNet_DNN, which combines Discrete Wavelet Transform (DWT) features with deep features extracted using AlexNet for texture image classification.

cs.CV

GeBDA: Building Damage Assessment as Text-Based Sequence Prediction

Conventionally, Building Damage Assessment (BDA) is tackled either with dedicated network architectures or by fine-tuning geospatial image foundation models. In this work, we ask whether a general-purpose Vision-Language Model (VLM) can localize buildings and grade their damage through autoregressive sequence generation alone. We cast BDA as predicting a variable-length set of bounding boxes, each specified by its coordinates and a damage label. Our preliminary implementation, based on the open Gemma model, achieves promising damage mapping results from only bi-temporal satellite images and a suitable text prompt.

cs.CV

SePArate: Segmenting Patterns from Defects in Wafer Manufacturing Using Weak Supervision

In semiconductor manufacturing, defect analysis is essential, but manual inspection cannot scale. However, existing automated inspection methods remain insufficient for root-cause analysis and process optimization. To this end, we present SePArate, a weakly supervised wafer defect segmentation method. SePArate enables pixel-level separation of patterns by leveraging only image-level annotations. It consists of a three-phase training: encoder pretraining, knowledge transfer to learn spatial cues, and training on synthetic mixed-defect data for accurate segmentation. Experiments demonstrate that SePArate outperforms the baselines.

cs.CV