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arXiv · 2606.30859

Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy

Steven R. Spurgeon·Renae N. Gannon
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Abstract

Scanning transmission electron microscopy (STEM) is a cornerstone of our understanding of oxide interfaces and superlattices. No other technique provides the same level of insight into structure, chemistry, composition, and dynamics across as wide a variety of material systems. STEM imaging and diffraction, coupled with electron energy loss (EELS) and energy-dispersive X-ray (EDS) spectroscopies, offer unparalleled, high-resolution analysis of structure--property relationships. In this chapter we highlight investigations into key phenomena, including interfacial conductivity in oxide superlattices, charge screening effects in magnetoelectric heterostructures, interface engineering in iron oxides, and the complex physics governing atomic-scale chemical mapping. We also discuss emerging plasma preparation techniques and artificial intelligence-guided approaches to both ex situ and in situ microscopy. These studies illustrate how unique insights from STEM characterization can be integrated with other techniques and theory calculations to develop more predictive models for the behavior of functional oxides.

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Steven R. Spurgeon, Renae N. Gannon. 2026-07-06. Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy. https://arxiv.org/abs/2606.30859

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