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Devesh Chopra

Publications and source records attributed to Devesh Chopra.

2 recordsLinked to original sources

Probing the formation of femtosecond laser-induced periodic surface structures on silica films by ultrafast small-angle X-ray scattering

Ultrashort X-ray pulses, as provided by X-ray Free Electron Lasers (XFELs), offer unique opportunities to probe the formation of laser-induced nanostructures with sizes even below the optical diffraction limit, with sub-micometer and sub-picosecond spatial and temporal resolution. Using ultrafast small-angle X-ray scattering (SAXS), we probe the formation of nanoscatterers and nanocracks in reciprocal space as they evolve into different types of laser-induced periodic surface structures (LIPSS) on silica films. Our focus is on the dynamics and evolution of nanoscatterers and high spatial frequency LIPSS (HSFL), with spatial periods below 100 nm. Our experiments include an in-situ analysis of the pulse-by-pulse evolution of HSFL at a fixed sample location, as well as fs time-resolved delay and fluence scans using an ultrafast pump-probe scheme. We find that nanoscatterers and periodic nanocracks form at delay times of hundreds of picoseconds and subsequently evolve into HSFL. At low laser fluences, inter-pulse incubation effects become important during multi-pulse irradiation. Simultaneously, inter-pulse feedback leads to an ordering and improve the regularity of the HSFL. The experiments are complemented by theoretical analyses, including numerical Finite-Difference Time-Domain (FDTD) simulations. These combined analyses allow us to propose a five-stage model of LIPSS formation on silica films upon irradiation with fs-laser pulses.

physics.optics↗

High frame rate RIXS spectroscopy using a JUNGFRAU detector with an iLGAD sensor

Resonant inelastic X-ray scattering (RIXS) is a powerful photon-in, photon-out spectroscopy technique for probing electronic, magnetic, and lattice excitations in matter. Time-resolved RIXS extends this capability through a stroboscopic optical pump-probe scheme to characterize the time evolution of the photoexcitation and subsequent relaxation dynamics of a sample. This technique is, however, extremely photon-hungry, requiring high-repetition-rate and intense X-ray facilities. The Heisenberg RIXS (hRIXS) spectrometer at the Spectroscopy and Coherent Scattering (SCS) instrument of the European X-ray Free-Electron Laser (EuXFEL) is designed to exploit high-repetition-rates, while maintaining optimal time and energy resolution. In this work, we demonstrate the successful deployment of a JUNGFRAU detector equipped with an inverse Low Gain Avalanche Diode (iLGAD) sensor for time-resolved RIXS studies in the soft X-ray range, using the hRIXS spectrometer. A spatial resolution of $19.71 \pm 0.7~μ\mathrm{m}$ and a resolving power exceeding 10,000 were achieved at an unprecedented frame rate of 47 kHz. Intra-train resolved data measured with a high FEL peak fluence of $1.8~\mathrm{mJ/cm^{2}}$ for a 928.5 eV ph photon energy and 1.1 MHz repetition rate from cupric oxide (CuO) revealed a decrease in the emitted signal by ~10% over a time interval of $340~μ\mathrm{s}$, indicating FEL-induced effects that require monitoring when conducting high-repetition-rate experiments. These results establish the JUNGFRAU-iLGAD as a promising detector to harvest the full potential of the hRIXS spectrometer, and validate its suitability for soft X-ray applications.

physics.ins-det↗