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R. Geppert

Publications and source records attributed to R. Geppert.

4 recordsLinked to original sources

AC-coupled GaAs microstrip detectors with a new type of integrated bias resistors

Full size single-sided GaAs microstrip detectors with integrated coupling capacitors and bias resistors have been fabricated on 3'' substrate wafers. PECVD deposited SiO_2 and SiO_2/Si_3N_4 layers were used to provide coupling capacitaces of 32.5 pF/cm and 61.6 pF/cm, respectively. The resistors are made of sputtered CERMET using simple lift of technique. The sheet resistivity of 78 kOhm/sq. and the thermal coefficient of resistance of less than 4x10^-3 / degree C satisfy the demands of small area biasing resistors, working on a wide temperature range.

physics.ins-det

Radiation damage to neutron and proton irradiated GaAs particle detectors

The radiation damage in 200 um thick Schottky diodes made on semi-insulating (SI) undoped GaAs Liquid Encapsulated Czochralski (LEC) bulk material with resistivities between 0.4 and 8.9*10E7 Ohm*cm were studied using alpha-spectroscopy, signal response to minimum ionising particles (MIP), I-V and CV-measurements. The results have been analysed to investigate the influence of the substrate resistivity on the detector performance after neutron and proton irradiation. The leakage current density, signal response to alpha-particles and MIPs show a strong dependence on the resistivity before and after irradiation. An observed decrease of the electron mean free drift length before and after irradiation with increasing substrate resistivity can be explained by a model involving the different ionisation ratios of defects, which are introduced by the irradiation. Comparison of the radiation damage due to neutrons and protons gives a hardness factor of 7+-0.9 for 24 GeV/c protons. The best detectors show a response to MIPs of 5250 e- at 200 V reverse bias after a irradiation level of 2*10E14 p/cm^2.

hep-ex

Analysis of Trapping and Detrapping in Semi-Insulating GaAs Detectors

To investigate the trapping and detrapping in SI-GaAs particle detectors we analyzed the signals caused by 5.48 MeV alpha particles with a charge sensitive preamplifier. From the bias and temperature dependence of these signals we determine the activation energies of two electron traps. Additional simulation and measurements of the lifetime as a function of resistivity have shown that the EL2+ is the dominant electron trap in semi-insulating GaAs.

hep-ex

Radiation studies for GaAs in the ATLAS Inner Detector

We estimate the hardness factors and the equivalent 1 MeV neutron fluences for hadrons fluences expected at the GaAs positions wheels in the ATLAS Inner Detector. On this basis the degradation of the GaAs particle detectors made from different substrates as a function of years LHC operation is predicted.

hep-ex